By Joe Kelly
That includes helpful enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its variety source bargains skilled engineers a accomplished knowing of the complex issues in RF, SiP (system-in-package), and SoC (system-on-a-chip) creation trying out which are serious to their paintings related to semiconductor units. The publication covers key dimension recommendations for semiconductor gadget trying out and assists engineers in explaining those ideas to administration to help cut back venture price, time, and assets. in line with real-world adventure and choked with time-saving equations, this in-depth quantity deals execs sensible info on crucial subject matters that experience by no means been provided in one reference ahead of.
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Additional resources for Advanced Production Testing of RF, SoC, and SiP Devices
Finding the exact frequency of a spur is normally done during characterization of the device. During production testing, a simple power measurement is then performed at exactly that frequency and, according to the power level, the device is then judged as either good or bad. A more serious problem is the occurrence of random spurs. Random spurs are spurs that are present at some frequencies in one DUT but are not present at the same frequencies in another DUT. 3 Spurs in the transmitting spectral output of an SoC device.
2, a PLL consists of two programmable dividers, a phase detector, a loop filter, a VCO, and a feedback loop. 12) More theory about PLLs can be found in . We now focus on some key measurements of PLLs in SoC devices. 12), the output frequency of a PLL is determined by the values of the two dividers N and R. Depending on the device and the application, the range of those dividers can be quite large, for instance, from 1 to 65,535. Stepping through all of those values is obviously not practical in a production test.
These anomalies are sometimes overlooked, however, and the results are taken to be analogous to their RF-to-RF counterparts. An important test item for receivers is sensitivity. The term sensitivity is an extension of the discrete RF device noise figure. With the discrete RF device, noise figure is a measure of sensitivity. The higher the noise figure, the harder it will be for a device to receive low-level signals. The all-encompassing term sensitivity is used with a receiver because it is possible to measure the full functionality of the SoC device.